Abstract:Single-walled carbon nanotubes are uniquely identified by a pair of chirality indices ( n , m ), which dictate the physical structures and electronic properties of each species 1 . Carbon nanotube research is currently facing two outstanding challenges: achieving chirality-controlled growth and understanding chirality-dependent device physics 2 , 3 , 4 , 5 , 6 . Addressing these challenges requires, respectively, high-throughput determination of the nanotube chirality distribution on growth substrates and in situ characterization of the nanotube electronic structure in operating devices. Direct optical imaging and spectroscopy techniques are well suited for both goals 7 , 8 , 9 , but their implementation at the single nanotube level has remained a challenge due to the small nanotube signal and unavoidable environment background 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 . Here, we report high-throughput real-time optical imaging and broadband in situ spectroscopy of individual carbon nanotubes on various substrates and in field-effect transistor devices using polarization-based microscopy combined with supercontinuum laser illumination. Our technique enables the complete chirality profiling of hundreds of individual carbon nanotubes, both semiconducting and metallic, on a growth substrate. In devices, we observe that high-order nanotube optical resonances are dramatically broadened by electrostatic doping, an unexpected behaviour that points to strong interband electron–electron scattering processes that could dominate ultrafast dynamics of excited states in carbon nanotubes.

Heterodyne High-Harmonic Electrostatic Force Microscopy with Improved Spatial Resolution for Nanoscale Identification of Metallic/Semiconducting Carbon Nanotubes

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Direct Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes in Scanning Electron Microscopy.

Electrochemical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes

J212015 Quantitative Evaluation of Conductivity of Metallic Nanowires by Microwave Atomic Force Microscopy

Non-contact Local Conductivity Measurement of Metallic Nanowires Based on Semi-Near-field Reflection of Microwave Atomic Force Microscopy

Direct discrimination between semiconducting and metallic single-walled carbon nanotubes with high spatial resolution by SEM

Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes

Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects

In situ measurements on individual thin carbon nanotubes using nanomanipulators inside a scanning electron microscope

Identification of the conductivity type of single-walled carbon nanotubes via dual-modulation dielectric force microscopy

Sharp-Tip Silver Nanowires Mounted on Cantilevers for High-Aspect-Ratio High-Resolution Imaging.

A local field emission study of partially aligned carbon-nanotubes by AFM probe

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes on Substrates

High-throughput optical imaging and spectroscopy of individual carbon nanotubes in devices

Detecting Carbon Nanotube Orientation with Topological Analysis of Scanning Electron Micrographs

Structural identification of single and double-walled carbon nanotubes by high-resolution transmission electron microscopy

High-Field Response And Direct Identification Of Metallic And Semiconducting Multiwalled Carbon Nanotubes

Detecting Carbon Nanotube Orientation with Topological Data Analysis of Scanning Electron Micrographs

High-throughput Imaging and Spectroscopy of Individual Carbon Nanotubes in Devices with Light Microscopy

The low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer scale objects: application to carbon nanotubes