A local field emission study of partially aligned carbon-nanotubes by AFM probe

A. Di Bartolomeo,A. Scarfato,F. Giubileo,F. Bobba,M. Biasucci,S. Santucci,M. Passacantando,A.M. Cucolo

DOI: https://doi.org/10.48550/arXiv.cond-mat/0702682

2007-02-28

Materials Science

Abstract:We report on the application of Atomic Force Microscopy (AFM) for studying the Field Emission (FE) properties of a dense array of long and vertically quasi-aligned multi-walled carbon nanotubes grown by catalytic Chemical Vapor Deposition on a silicon substrate. The use of nanometric probes enables local field emission measurements allowing investigation of effects non detectable with a conventional parallel plate setup, where the emission current is averaged on a large sample area. The micrometric inter-electrode distance let achieve high electric fields with a modest voltage source. Those features allowed us to characterize field emission for macroscopic electric fields up to 250 V/$\mu$m and attain current densities larger than 10$^5$ A/cm$^2$. FE behaviour is analyzed in the framework of the Fowler-Nordheim theory. A field enhancement factor $\gamma \approx$ 40-50 and a turn-on field $E_{turn-on} \sim$15 V/$\mu$m at an inter-electrode distance of 1 $\mu$m are estimated. Current saturation observed at high voltages in the I-V characteristics is explained in terms of a series resistance of the order of M$\Omega$. Additional effects as electrical conditioning, CNT degradation, response to laser irradiation and time stability are investigated and discussed.