Abstract:Single-walled carbon nanotubes are uniquely identified by a pair of chirality indices ( n , m ), which dictate the physical structures and electronic properties of each species 1 . Carbon nanotube research is currently facing two outstanding challenges: achieving chirality-controlled growth and understanding chirality-dependent device physics 2 , 3 , 4 , 5 , 6 . Addressing these challenges requires, respectively, high-throughput determination of the nanotube chirality distribution on growth substrates and in situ characterization of the nanotube electronic structure in operating devices. Direct optical imaging and spectroscopy techniques are well suited for both goals 7 , 8 , 9 , but their implementation at the single nanotube level has remained a challenge due to the small nanotube signal and unavoidable environment background 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 . Here, we report high-throughput real-time optical imaging and broadband in situ spectroscopy of individual carbon nanotubes on various substrates and in field-effect transistor devices using polarization-based microscopy combined with supercontinuum laser illumination. Our technique enables the complete chirality profiling of hundreds of individual carbon nanotubes, both semiconducting and metallic, on a growth substrate. In devices, we observe that high-order nanotube optical resonances are dramatically broadened by electrostatic doping, an unexpected behaviour that points to strong interband electron–electron scattering processes that could dominate ultrafast dynamics of excited states in carbon nanotubes.

Structural identification of single and double-walled carbon nanotubes by high-resolution transmission electron microscopy

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Atom-Resolved Imaging of Carbon Hexagons of Carbon Nanotubes

Imaging the symmetry breaking of molecular orbitals in carbon nanotubes

Investigation of the Fabrication and Structure of Double-Wall Carbon Nanotubes

Quantitative analysis of electron field-emission characteristics of individual carbon nanotubes: The importance of the tip structure

In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

Coupled Thermomechanics Of Single-Wall Carbon Nanotubes

Complete structural characterization of single carbon nanotubes by Rayleigh scattering circular dichroism

Direct Determination of Atomic Structure of Large-Indexed Carbon Nanotubes by Electron Diffraction: Application to Double-Walled Nanotubes

Electron diffraction analysis of individual single-walled carbon nanotubes

Determine the complete configuration of single carbon nanotubes by one photograph of transmission electron microscopy

High-throughput optical imaging and spectroscopy of individual carbon nanotubes in devices

Atomic-Resolution Imaging of the Nucleation Points of Single-Walled Carbon Nanotubes

Structural characterization of carbon nanotubes and nanoparticles by high-resolution electron microscopy

Combination of Confocal Raman Spectroscopy and Electron Microscopy on the Same Individual Bundles of Single-Walled Carbon Nanotubes

High-throughput Imaging and Spectroscopy of Individual Carbon Nanotubes in Devices with Light Microscopy

Extended Kataura Plot of Single-Walled Carbon Nanotubes and On-Demand Fabrication of Mixed-Dimensional Heterostructures

Heterodyne High-Harmonic Electrostatic Force Microscopy with Improved Spatial Resolution for Nanoscale Identification of Metallic/Semiconducting Carbon Nanotubes

Physical and electronic structure in carbon nanotubes

Field-ion Microscope Study of Single-walled Carbon Nanotube