Abstract:We demonstrate here a novel method for performing in situ mechanical, electrical and electromechanical measurements on individual thin carbon nanotubes (CNTs) by using nanomanipulators inside a scanning electron microscope. The method includes three key steps: picking up an individual thin CNT from a substrate, connecting the CNT to a second probe or an atomic force microscope cantilever for the measurements and placing the CNT onto a holey carbon film on a transmission electron microscope grid for further structure characterization. With the method, Young’s modulus, the breaking strength and the effects of axial strain on electrical transport properties of individual thin CNTs can be studied. As examples, the mechanical, electrical and electromechanical properties of a double-walled CNT (DWCNT) and a single-walled CNT (SWCNT) were measured. We observed a strain-induced metallic-to-semiconducting transition of the DWCNT and a bandgap increase of the SWCNT. More importantly, the electromechanical properties of the SWCNT were correlated to its chirality determined by electron diffraction. The method enables us to relate mechanical, electrical and electromechanical properties of the measured thin CNTs to their atomic structures.

Electron diffraction analysis of individual single-walled carbon nanotubes

Imaging the symmetry breaking of molecular orbitals in carbon nanotubes

Quantitative analysis of electron field-emission characteristics of individual carbon nanotubes: The importance of the tip structure

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Structural identification of single and double-walled carbon nanotubes by high-resolution transmission electron microscopy

Physical and electronic structure in carbon nanotubes

Field Electron Emission From Individual Carbon Nanotubes Of A Vertically Aligned Array

Electron microscopy and in situ testing of mechanical deformation of carbon nanotubes.

Direct Determination of Atomic Structure of Large-Indexed Carbon Nanotubes by Electron Diffraction: Application to Double-Walled Nanotubes

Electrons for single molecule diffraction and imaging.

Atom-Resolved Imaging of Carbon Hexagons of Carbon Nanotubes

Electronic Raman Scattering On Individual Single Walled Carbon Nanotubes

High-Energy X-Ray Diffraction Study of Multiwalled Carbon Nanotubes Fabricated by Arc Discharge Plasma Process

Optical Spectroscopy of Individual Single-Walled Carbon Nanotubes

Field-ion Microscope Study of Single-walled Carbon Nanotube

In situ measurements on individual thin carbon nanotubes using nanomanipulators inside a scanning electron microscope

Study on Electronic Properties of Single-Wall Carbon Nanotubes

Cross-sectional transmission electron microscopic study on carbon nanotubules

Atomic structure and electronic properties of single-walled carbon nanotubes

Atomic configuration of nitrogen-doped single-walled carbon nanotubes

Ab Initio Modeling of the Interaction of Electron Beams and Single-Walled Carbon Nanotubes.