Electron Beam Interaction with Carbon Nanotubes in Scanning Electron Microscope: Mechanisms and Applications
Guo Chen,Zi Yuan,Yuanqi Wei,Xuze Fu,Kaili Jiang
DOI: https://doi.org/10.1002/adfm.202404682
IF: 19
2024-07-18
Advanced Functional Materials
Abstract:The SEM images of carbon nanotubes, which contain the information of surface morphology, materials, and charge effects, can be used to characterize the electrical properties of carbon nanotubes. On the other hand, carbon nanotubes can be used to eliminate the charging effect and absorb stray electrons, thus improving the quality of SEM imaging. A comprehensive understanding of the interaction between electron beams and carbon nanotubes (CNTs) in scanning electron microscope (SEM) can be challenging due to the complex surface charging behavior and various nanostructures formed by CNTs. Herein, an overview of the challenges and potential solutions are provided for achieving high‐resolution imaging of nanomaterials, such as CNTs, in SEM systems. First, imaging mechanisms of CNTs on conducting, insulating, and hybrid substrates are summarized, with morphology, material type, and charging effect covered. Second, measuring the conductivity, bandgap, and diameter of a CNT by SEM method is introduced. Finally, the utilization of super‐aligned CNT (SACNT) films for observing insulators and vertically aligned CNT arrays (VACNTAs) as electron blackbodies are discussed separately. New techniques for imaging and characterizing nanostructures will ultimately lead to the advancement of CNT‐based technologies.
materials science, multidisciplinary,nanoscience & nanotechnology,physics, applied,chemistry, physical, condensed matter