Abstract:Raman spectroscopy is a powerful technique in the characterization of carbon nanotubes (CNTs). However, this spectral method is subject to two obstacles. One is spatial resolution, namely the diffraction limits of light, and the other is its inherent small Raman cross section and weak signal. To resolve these problems, a new approach has been developed, denoted tip-enhanced Raman spectroscopy (TERS). TERS has been demonstrated to be a powerful spectroscopic and microscopic technique to characterize nanomaterial or nanostructures. Excited by a focused laser beam, an enhanced electric field is generated in the vicinity of a metallic tip because of the surface plasmon polariton (SPP) and lightening rod effect. Consequently, Raman signal from the sample area illuminated by the enhanced field nearby the tip is enhanced. At the same time, the topography is obtained in the nanometer scale. The exact corresponding relationship between the localized Raman and the topography makes the Raman identification at the nanometer scale to be feasible. In the present paper, based on an inverted microscope and a metallic AFM tip, a tip-enhanced Raman system was set up. The radius of the Au-coated metallic tip is about 30 nm. The 532 nm laser passes through a high numerical objective (NA0.95) from the bottom to illuminate the tip to excite the enhanced electric field. Corresponding with the AFM image, the tip-enhanced near-field Raman of a 100 nm diameter single-walled carbon nanotube (SWNT) bundles was obtained. The SWNTs were prepared by arc method. Furthermore, the near-field Raman of about 3 SWNTs of the bundles was received with the spatial resolution beyond the diffraction limit. Compared with the far-field Raman, the enhancement factor of the tip-enhanced Raman is more than 230. With the super-diffraction spatial resolution and the tip-enhanced Raman ability, tip-enhanced Raman spectroscopy will play an important role in the nano-material and nano-structure characterization.

Combination of Confocal Raman Spectroscopy and Electron Microscopy on the Same Individual Bundles of Single-Walled Carbon Nanotubes

In-situ studies of electron field emission of single carbon nanotubes inside the TEM

Low-Temperature Raman Spectroscopy of Individual Single-Wall Carbon Nanotubes and Single-Layer Graphene

Detection of Single-Walled Carbon Nanotube Bundles by Tip-Enhanced Raman Spectroscopy

Observation of the Resonant Raman Behavior of Individual Single-Walled Carbon Nanotubes

Transmission Electron Microscopy and Transistor Characteristics of the Same Carbon Nanotube

Experimental observation of individual single-wall nanotube species by Raman microscopy

Electronic Raman Scattering On Individual Single Walled Carbon Nanotubes

Assembling Structure of Single-Walled Carbon Nanotube Thin Bundles

Single Gold-Nanoparticle-Enhanced Raman Scattering of Individual Single-Walled Carbon Nanotubes via Atomic Force Microscope Manipulation

Resonant Raman spectra of carbon nanotube bundles observed by perpendicularly polarized light

X-Ray Photoelectron Microscopy of the C 1s Core Level of Free-Standing Single-Wall Carbon Nanotube Bundles

Field emission patterns with atomic resolution of single-walled carbon nanotubes by field emission microscopy

Structural identification of single and double-walled carbon nanotubes by high-resolution transmission electron microscopy

High-resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes.

Tip-Enhanced Raman Spectroscopic Imaging of Individual Carbon Nanotubes with Subnanometer Resolution

Atomically Resolved Field Emission Patterns of Single-Walled Carbon Nanotubes

Electronic Raman Scattering On Individual Semiconducting Single Walled Carbon Nanotubes

Scanning Tunneling Microscopy and Spectroscopy Studies of Single Wall Carbon Nanotubes

Transient Absorption Spectroscopy and Imaging of Individual Chirality-Assigned Single-Walled Carbon Nanotubes

Transport And Tem On Individual Nanotubes And Nanotube Peapods