Abstract:The essence of electrochemical reaction was the electron transfer process on the electrode while the premise for electrochemical reaction happening was the migration and diffusion of electro-active species. Interpreting the monitoring process of electrode towards the electro-active species during the electrochemical reaction would really do favor to the further understanding of the electrochemical evolution process at the electrode-electrolyte interface. In this work, time-of-flight secondary ion mass spectrometry (ToF-SIMS) was adopted for the in-situ monitoring of the electrode-electrolyte interface during the electrochemical reaction with the cooperation of a microfluidic electrochemical cell which was constructed for the liquid sample analysis under the high vacuum environment. With the application of the primary ion beam on the silicon nitride membrane of the microfluidic cell, a micro-hole with the diameter of 2 mu m would be fabricated for the direct monitoring of the electrode-electrolyte interface. The migration process of KCl aqueous solution in the confined micropore under the monitoring of gold electrode was investigated by ToF-SIMS here. The direct observation of K+(H2O)(n) and H+(H2O)(n) in the electrolyte provided information of the electrode-electrolyte interface at molecular level. Besides, the chemical distributions of K+ and H+(H2O)(n) under different potential were also studied to verify the feasibility of pore-confined ToF-SIMS in visualizing electrochemical evolution process on the electrode-electrolyte interface. The chemical distributions of K+ and H+(H2O)(n) obtained by ToF-SIMS showed that K+ would enrich to the surface of gold electrode when the negative potential was applied but diffuse to the bulk solution when positive potential was applied. For H+(H2O)(n) they would he repulsed away from the electrode when the positive potential was applied and enrich to the surface of electrode when the negative potential was applied. The potential-dependent behaviors of K+ and H+(H2O)(n )indicated that visualization of the migration process of electrolyte on the electrode-electrolyte interface was realized, which may help the further study of the evolution at electrode-electrolyte interface during the electrochemical reaction, providing new insight into the revealment of the mechanism of electrochemical reaction.

Etching profiles in two-dimensional electrochemical solution

A two-dimensional computer simulation for dry etching using Monte Carlo techniques

Monte Carlo Simulation of Defects of a Trench Profile in the Process of Deep Reactive Ion Etching of Silicon

A Monte Carlo microtopography model for investigating plasma/reactive ion etch profile evolution

Three-dimensional cellular model for profile simulation of ion etching process

Simulation of anisotropic chemical etching of crystalline silicon using a cellular automata model

Simulation of two-dimensional etch profile of silicon during orientation-dependent anisotropic etching

Simulation of Anisotropic Chemical Etching of Single Crystalline Silicon using Cellular-Automata

Monte Carlo low pressure deposition profile simulations

Study of high aspect ratio etching in silicon by a mixture of SF6/O2 using a 2-D model based on a Monte Carlo approach.

Monte Carlo simulation and measurement of silicon reactive ion etching profiles

Ion Transport in an Electrochemical Cell: A Theoretical Framework to Couple Dynamics of Double Layers and Redox Reactions for Multicomponent Electrolyte Solutions

Two-Dimensional Chemical Etching Process Simulation for Printed Circuit Heat Exchanger Channels Based on Cellular Automata Model

Molecular dynamics simulation of electrokinetic flow of an aqueous electrolyte solution in nanochannels

Classical density functional theory and Monte Carlo simulation study of electric double layer in the vicinity of a cylindrical electrode

Simulation of profile evolution in etching-polymerization alternation in drie of silicon with SF6/C4F8

Visualization of the Electrolyte Migration under Electrochemical Process by ToF-SIMS

Study of etched ion track profiles in silicon dioxide membrane

Simulation of Leveling in Electrodeposition

Etching Characteristic for Tracks of Multicharged Ions in Polymer

Correlated Surface-Charging Behaviors of Two Electrodes in an Electrochemical Cell.