Abstract:Many types of radiation particles are found in natural and artificial radiation environments; for instance, protons, electrons, heavy ions and neutrons, gamma rays, and X-rays. These radiation particles may induce transient ionizing dose effects, single event effects, displacement damage, and total ionizing dose effects in electronic devices, resulting in performance degradation, function abnormality, malfunction, and even failure in systems containing these devices. For example, 45% of the observed failures were due to radiation damage in artificial satellites working in space radiation environments. Thus, radiation damage plays a key role in restricting the long-term stability and reliability of electronic devices and the corresponding systems. Simulation test techniques for nuclear and space radiation effects are important foundations of radiation-hardness assurance studies, which can be useful for studying the basic mechanisms of radiation effects and estimating the effectiveness of hardness assurance methods, and indispensable for improving the reliability of electronics and the corresponding systems. In this study, four topics are presented, covering simulation test techniques for transient ionizing dose effects, single event effects, displacement damage, and total ionizing dose effects. For each topic, first, the status of radiation effect studies and experimental equipment suitability for performing radiation effect tests at home and abroad were reviewed. Second, the future development trends, along with the rapid progress in the field of microelectronics, were summarized based on information reported in references, and scientific and technical problems that should be heeded were raised and analyzed. This study can provide a reference for guiding the directions of radiation-hardness assurance.

A Design of Single Event Effect Test System

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SINGLE EVENT EFFECT CHARACTERISTICS ANALYSIS OF TYPICAL CIRCUIT ELEMENTS IN SPACECRAFT POWER SYSTEMS

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Research on Single Event Effects of Ethernet MAC Controller on Manned Spacecraft

The Aerospace Corporation’s Compendium of Recent Single Event Effect Results

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System-on-chip Single Event Effect Hardening Design and Validation Using Proton Irradiation

Prototype of single-event effect localization system with CMOS pixel sensor

Experimental Studies of Single-Event Effects Induced by Heavy Ions

Single Event Effect Characterization of High Speed Serial JESD204B Data Receiver

Single Event Effects Testing of Xilinx Zynq-7010 SoC with 239Pu Alpha Irradiation

Single Event Effect Hardness for the Front-End Asics in the Dampe Satellite Bgo Calorimeter

Radiation-Induced Single-Event Effects on the Van Allen Probes Spacecraft