Abstract:Complex integrated circuits (ICs) have complex functions and various working modes, which have many factors affecting the performance of a single event effect. The single event effect performance of complex ICs is highly program-dependent and the single event sensitivity of a typical operating mode is generally used to represent the single event performance of the circuits. Traditional evaluation methods fail to consider the cross effects of multiple factors and the comprehensive effects of each factor on the single event soft error cross section. In order to solve this problem, a new quantitative study method of single event error cross section based on a generalized linear model for different test programs is proposed. The laser test data is divided into two groups: a training set and a validation set. The former is used for model construction and parameter estimation based on five methods, such as the generalized linear model and Ensemble, while the latter is used for quantitative evaluation and validation of a single event soft error cross section of the model. In terms of percentage error, the minimum mean estimation error on the validation set is 13.93%. Therefore, it has a high accuracy to evaluate the single event soft error cross section of circuits under different testing programs based on the generalized linear model, which provides a new idea for the evaluation of a single event effect on complex ICs.

Design and Verification of Universal Evaluation System for Single Event Effect Sensitivity Measurement in Very-Large-scale Integrated Circuits

The single-event effect evaluation technology for nano integrated circuits

Measurement System of Single Event Latchup Radiation Effects for Very Large Scale Integrated Circuits

Primary Single Event Effect Studies on Xilinx 28-Nm System-on-Chip (Soc)

Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits

Quantitative Research on Generalized Linear Modeling of SEU and Test Programs Based on Small Sample Data

Single Event Effects Testing of Xilinx Zynq-7010 SoC with 239Pu Alpha Irradiation

Investigation of Single Event Effect in 28-Nm System-on-chip with Multi Patterns?

Measurement of Single Event Effect cross section induced by monoenergetic protons on a 130 nm ASIC

Design of Single-Event Tolerant Latches in 65nm CMOS Technology for Enhanced Scan Delay Testing

A LabVIEW Based Automatic Test System for Sieving Chips

Characterization of Single Event Upsets of Nanoscale FDSOI Circuits Based on the Simulation and Irradiation Results

System Efficient ESD Design of IO ESD Protection

Experimental Studies of Single-Event Effects Induced by Heavy Ions

A Single Event Effect Simulation Method for RISC-V Processor

SSRESF: Sensitivity-aware Single-particle Radiation Effects Simulation Framework in SoC Platforms based on SVM Algorithm

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research

Single Event Effect Characterization of High Speed Serial JESD204B Data Receiver

Single Event Effect Detection and Simulation Analysis for an ASIC

Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology