Abstract:The ever-expanding scale of integrated circuits has brought about a significant rise in the design risks associated with radiation-resistant integrated circuit chips. Traditional single-particle experimental methods, with their iterative design approach, are increasingly ill-suited for the challenges posed by large-scale integrated circuits. In response, this article introduces a novel sensitivity-aware single-particle radiation effects simulation framework tailored for System-on-Chip platforms. Based on SVM algorithm we have implemented fast finding and classification of sensitive circuit nodes. Additionally, the methodology automates soft error analysis across the entire software stack. The study includes practical experiments focusing on RISC-V architecture, encompassing core components, buses, and memory systems. It culminates in the establishment of databases for Single Event Upsets (SEU) and Single Event Transients (SET), showcasing the practical efficacy of the proposed methodology in addressing radiation-induced challenges at the scale of contemporary integrated circuits. Experimental results have shown up to 12.78X speed-up on the basis of achieving 94.58% accuracy.

What problem does this paper attempt to address?

### Problems the Paper Attempts to Solve This paper aims to address the design risk issues of Single Event Effects (SEE) in large-scale integrated circuit chips under radiation environments. As the scale of integrated circuits continues to expand, traditional single-event experimental methods, due to their iterative design approach, can no longer cope with the challenges faced by large-scale integrated circuits. Specifically, traditional methods have the following problems: 1. **High experimental costs**: Space experiments and ground radiation experiments are limited by experimental funding, cycles, and costs, making it difficult to widely evaluate the radiation tolerance of integrated circuits. 2. **Low simulation efficiency**: Although existing fault simulation technologies can accurately simulate the interaction between high-energy particles and chips, the exponential growth in the complexity of large-scale integrated circuit design means that full-mode single-event experimental evaluations may take years, making comprehensive evaluation and worst-case identification almost impossible. 3. **Ignoring actual working environments**: Existing fault simulation methods mainly rely on theoretical models and computational algorithms, often neglecting the actual working environment of the circuit and its changes during operation. 4. **Knowledge gaps**: Previous studies on single-event effects have mainly focused on individual functional modules (such as RAM, CPU, and FPGA), lacking an overall analysis of System-on-Chip (SoC) design. To address these issues, the paper proposes a Sensitivity-Aware Single Event Radiation Effect Simulation Framework (SSRESF) based on the Support Vector Machine (SVM) algorithm, specifically targeting SoC platforms. The main contributions of this framework include: 1. **Development of a single-event radiation effect simulation framework** for fault injection, simulation, and automatic soft error analysis of gate-level netlists. 2. **Introduction of a rapid circuit node classification method** using the SVM algorithm to accelerate single-event effect simulation. 3. **Implementation of dynamic simulation and data analysis of the RISC-V PULP SoC**, demonstrating up to 12.78 times speed improvement with an average accuracy rate of 94.58%. Through these contributions, the paper provides an efficient and accurate method to evaluate and analyze the single-event effects on SoC platforms under radiation environments, thereby improving the reliability and safety of integrated circuit design.

SSRESF: Sensitivity-aware Single-particle Radiation Effects Simulation Framework in SoC Platforms based on SVM Algorithm

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