An Integrated Low-Power Enhanced Pull-Up GaN Driver Using SenseHEMT for Reliable and Fast Short-Circuit Protection

Chun-wang Zhuang,Xin Ming,Zi-kai Ye,Yao Qin,Xin-ce Gong,Yi Lu,Si-chao Li,Qi Zhou,Bo Zhang
DOI: https://doi.org/10.1109/ispsd59661.2024.10579657
2024-01-01
Abstract:This article proposed an integrated GaN driver with a low-power enhanced pull-up (LPEP) technique to achieve the decoupling between the charging path and the leakage path of the inverter in the driver. Considering the poor short-circuit tolerance of GaN power HEMTs, a low-loss fast short-circuit detection (FSCD) technique using senseHEMT is proposed for reliable and fast short-circuit protection. Experimental results show that the leakage current of the single-stage inverter is 28 mu A and the rise time of the gate voltage V-G of powerHEMT is 0.71ns. The measured minimum short-circuit response time is 37ns.
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