A High-Speed Low Side GaN E-Hemt Driver with Gate Ringing and Overshoot Suppression.

Jian Jin,Mengyuan Sun,Yannan Yang,Min Xu,David Wei Zhang
DOI: https://doi.org/10.1587/elex.19.20220144
2022-01-01
IEICE Electronics Express
Abstract:A new circuit architecture to drive GaN e-HEMT power device was proposed in this work, which was taped out on TSMC 0.18 um BCD process and successfully tested. With the proposed driver circuit, gate voltage overshoot as well as ringing on GaN e-HEMT device has been successfully suppressed, while not sacrificing GaN e-HEMT advantage of high switching speed. The proposed GaN driver realized 1.1 ns rising time, 910 ps falling time, and minimum 1.8 ns output pulse width with almost no gate ringing and overshoot. This technology could potentially improve the system stability and reliability when driving GaN e-HEMT power devices.
What problem does this paper attempt to address?