Gate Driver Design for SiC Power MOSFETs with a Low-Voltage GaN HEMT for Switching Loss Reduction and Gate Protection

Ji Shu,Jiahui Sun,Zheyang Zheng,Kevin J. Chen
DOI: https://doi.org/10.1109/tpel.2024.3353460
IF: 5.967
2024-01-01
IEEE Transactions on Power Electronics
Abstract:The design of gate drivers for silicon carbide (SiC) power mosfets needs to address various adverse effects induced by the parasitic inductance in the gate loop, such as false turn-on, gate overstress, and reduced switching speed. In this work, a single-polarity gate driver design featuring a low-voltage (LV) gallium nitride (GaN) high-electron-mobility transistor (HEMT) for Miller clamping is presented. The lateral LV GaN HEMT can switch at a much higher speed than that of the SiC mosfet, so that the proposed gate driver can well suppress false turn-on with a user-friendly off-state gate voltage of 0 V. Meanwhile, the reverse-conduction characteristics of the LV GaN HEMT allow the clamping of negative voltage spikes to protect the SiC mosfet against gate overstress, which is shown to be detrimental to the gate reliability. In addition, the LV GaN HEMT can accelerate the turn-off process and suppress the gate-loop oscillation, thereby further reducing the switching loss, as verified by experiment results.
engineering, electrical & electronic
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