Electro-Thermal Coupling Characteristics and Modeling of SiC MOSFET Modules under High Pulse Current Conditions

Zaojun Ma,Yunqing Pei,Laili Wang,Qingshou Yang,Tongyu Zhang,Haihua Wang
DOI: https://doi.org/10.1109/ipemc-ecceasia60879.2024.10567251
2024-01-01
Abstract:Silicon carbide (SiC) MOSFETs help to achieve high efficiency, high frequency, and high power density for power electronic converters. When applied in fields such as pulsed power supplies and solid-state circuit breakers, SiC MOSFETs will withstand instantaneous high pulse current shocks and significant temperature fluctuations. Thanks to high-temperature packaging technology, the working junction temperature of SiC MOSFETs can exceed 175 ℃. However, the electro-thermal coupling characteristics of SiC MOSFETs under high pulse current are not yet clear. In this paper, a nano-silver sintered half-bridge SiC MOSFET module is designed and fabricated, which allows SiC MOSFETs to operate at higher junction temperatures. Then an electro-thermal coupling model is established based on MATLAB/Simulink and COMSOL over a wide temperature range (25 ~ 375℃). Thus, the electro-thermal coupling characteristics of the SiC MOSFET module are studied in detail. Finally, some experiments are carried out to verify the model.
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