Thickness-dependent Transport Properties of La2/3Sri/3MnO3 Polycrystalline Films

Youwei Du
2003-01-01
Journal of Functional Biomaterials
Abstract:A series of La2/3Sr1/3MnO3 polycrystalline films with various thickness t were prepared on Si(100) substrate with oxidized surface using magnetron sputtering technique. A critical thickness of about 73nm was observed upon their transport properties. As t 73nmt the films show the bulk-like transport properties. While as t73nm, the resistance of the films was too large and the metal-insulator transition temperature (Tp) becomes unmeasurable. The results of X-ray diffraction (XRD) show a structure phase transition taking place around t = 73nm. It suggests that the phase transition may account for the thickness-dependent transport properties of La2/3 Sr1/3 MnO3 polycrystalline films.
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