Critical Thickness and Orbital Ordering in Ultrathinla0.7sr0.3mno3films

M. Huijben,L. W. Martin,Y. -H. Chu,M. B. Holcomb,P. Yu,G. Rijnders,D. H. A. Blank,R. Ramesh
DOI: https://doi.org/10.1103/physrevb.78.094413
IF: 3.7
2008-01-01
Physical Review B
Abstract:Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La0.7Sr0.3MnO3 films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO3 (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties.
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