Thickness dependent magnetotransport in ultra-thin manganite films

J. Z. Sun,D. W. Abraham,R. A. Rao,C. B. Eom

DOI: https://doi.org/10.1063/1.124050

1998-09-30

Abstract:To understand the near-interface magnetism in manganites, uniform, ultra-thin films of La_{0.67}Sr_{0.33}MnO_3 were grown epitaxially on single crystal (001) LaAlO_3 and (110) NdGaO_3 substrates. The temperature and magnetic field dependent film resistance is used to probe the film's structural and magnetic properties. A surface and/or interface related dead-layer is inferred from the thickness dependent resistance and magnetoresistance. The total thickness of the dead layer is estimated to be $\sim 30 Å$ for films on NdGaO_3 and $\sim 50 Å$ for films on LaAlO_3.

Materials Science,Strongly Correlated Electrons

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to understand the magnetic behavior of manganese oxide films (especially La$_{0.67}$Sr$_{0.33}$MnO$_3$, abbreviated as LSMO) near the interface and determine their thickness - dependent magnetotransport properties. Specifically, the researchers are concerned with:

1. **Existence and thickness of surface and interface dead layers**: In the experiment, it was found that as the film thickness decreases, the resistivity increases, indicating the existence of a "dead layer" with lower conductivity. This dead layer may be caused by the weakened magnetic order at the surface or interface. By measuring the resistance and magnetoresistance of films with different thicknesses, the researchers inferred the total thickness of the dead layer.

2. **Effects of temperature and magnetic field on film resistance**: By measuring the film resistance at different temperatures and magnetic fields, the researchers attempted to understand how these factors affect the structure and magnetic properties of the film. In particular, they hoped to explain why, at certain temperatures, the magnetoresistance of the film disappears prematurely, which is inconsistent with the Curie temperature of the material.

3. **Effect of substrate type on film performance**: To evaluate the effect of the substrate on film performance, the researchers selected two different substrate materials - (001) LaAlO$_3$ (LAO) and (110) NdGaO$_3$ (NGO), and compared the resistivity and magnetoresistance characteristics of the films grown on these two substrates.

### Main Conclusions

- The researchers experimentally estimated the total thickness of the dead layer: for the film grown on NdGaO$_3$, the dead layer thickness is approximately 30 Å; for the film grown on LaAlO$_3$, the dead layer thickness is approximately 50 Å.
- The peak temperature of the magnetoresistance of the dead layer is approximately between 100 and 200 K, which may reflect the Curie temperature of the dead layer.
- By excluding the possibilities of strain effects and incomplete initial coverage, the researchers confirmed that the thickness - dependent resistance change is mainly caused by the surface and/or interface dead layer.

### Formula Summary

- Variation of resistivity with temperature: $\rho(T)$
- Total conductance $G=\frac{1}{R_\square}$, where $R_\square$ is the sheet resistance obtained by four - probe measurement.
- Magnetoresistance $\Delta R(H)=\frac{R(H)-R(0)}{R(0)}$

These results provide important experimental basis for understanding the magnetic and electrical transport properties in ultra - thin manganese oxide films.