Thickness Dependence Of Morphology In La2/3ca1/3mno3 Thin Films (Vol 19, Pg 2409, 2005)

Y. M. Zhang,X. S. Wu,Shui-sheng Jiang,W. S. Tan,J. Gao

DOI: https://doi.org/10.1142/S0217979205032528

2005-01-01

International Journal of Modern Physics B

Abstract:La2/3Ca1/3MnO3 (LCMO) thin films with the thickness from 4 nm to 50 nm were fabricated by the off-axis magnetron sputtering technique. Single crystal (001) SrTiO3 (STO), (0001) sapphire (ALO), and (001) yttrium-stabilized ZrO2 (YSZ) were used as substrates. The surface morphology of thin films was characterized by atomic force microscope (AFM). The surface morphology of the thin films depends on the thickness. Thin films on STO substrate with the thickness less than 20 nm show a wave-like morphology, which indicates a two-dimension growth mode. With the thickness increasing, some cracks and grains appear on the surface, which indicates the release of the lattice strain due to the lattice mismatch between the substrates and the films. The morphology became smoother with the thickness more than 30 nm, which indicates the full relaxation in strain for the films. The surface roughness and the average grain size increase with the thickness. The morphology for LCMO growing on ALO and YSZ shows a rougher surface than that on STO. The rough surface morphology may indicate the wide metallic-to-insulating transition in transport properties.