Abstract:With the rapid advancement of information technology, microelectronic devices have found widespread applications in critical sectors such as nuclear power plants, aerospace equipment, and satellites. However, these devices are frequently exposed to diverse radiation environments, presenting significant challenges in mitigating radiation-induced damage. Hence, this review aims to delve into the intricate damage mechanisms of microelectronic devices within various radiation environments and highlight the latest advancements in radiation-hardening techniques. The ultimate goal is to bolster the reliability and stability of these devices under extreme conditions. The review initiates by outlining the spectrum of radiation environments that microelectronic devices may confront, encompassing space radiation, nuclear explosion radiation, laboratory radiation, and process radiation. It also delineates the potential damage types that these environments can inflict upon microelectronic devices. Furthermore, the review elaborates on the underlying mechanisms through which different radiation environments impact the performance of microelectronic devices, which includes a detailed analysis of the characteristics and fundamental mechanisms of damage when microelectronic devices are subjected to total ionizing dose effects and single-event effects. In addition, the review delves into the promising application prospects of several key radiation-hardening techniques for enhancing the radiation tolerance of microelectronic devices.

Radiation Effects and Radiation Hardening Technology of New Microsystems

Overview of radiation hardening techniques for IC design

Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices

Radiation Effects of Advanced Electronic Devices and Circuits

Progress of Radiation Damage Effects and Hardening Technology on CCD

Progress Review of Electromagnetic Compatibility Analysis Technologies for Packages, Printed Circuit Boards, and Novel Interconnects

Research on P-Channel VDMOS Radiation Hardened Technology

Radiation hardening and sensors for radioactive environments

Radiation Risks and Mitigation in Electronic Systems

Low-power electronic technologies for harsh radiation environments

Research on Microelectron-Mechanical System and Its Application

Radiation Effects in Novel Nuclear Materials

Hardening Architectures for Multiprocessor System-on-Chip

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Layout Based Radiation Hardening Techniques Against Single-Event Transient

Research on Radiation Damage and Reinforcement of Control and Sensing Systems in Nuclear Robots

Neutron Irradiation Testing and Monte Carlo Simulation of a Xilinx Zynq-7000 System on Chip

Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips

Analysis and modeling of space radiation effects in quantum dot based nanomaterials for high-efficiency photovoltaic cells

Effects of 60Co γ ray radiation on the transmission characteristics of interconnection structures for 3D packaging

Research on B4C/PEEK Composite Material Radiation Shielding