Radiation Effects of Advanced Electronic Devices and Circuits

Yaqing Chi,Chang Cai,Li Cai

DOI: https://doi.org/10.3390/electronics13061073

IF: 2.9

2024-03-15

Electronics

Abstract:Research on the effects of radiation on advanced electronic devices and integrated circuits has experienced rapid growth over the last few years, resulting in many approaches being developed for the modeling of radiation's effects and the design of advanced radiation-hardened electronic devices and integrated circuits [...]

engineering, electrical & electronic,computer science, information systems,physics, applied

What problem does this paper attempt to address?

The paper primarily explores the effects of advanced electronic devices and integrated circuits in radiation environments. Specifically, the paper covers the following aspects:

1. **Research Progress on Radiation Effects**: In recent years, there has been rapid development in the study of the impact of radiation on advanced electronic devices and integrated circuits. Many methods have been developed for modeling radiation effects and designing radiation-hardened electronic devices.

2. **Exploration of Materials and Device Architectures**: The paper focuses on the design of new materials and device architectures to enhance radiation tolerance. It introduces advanced simulation tools and modeling techniques to accurately predict the behavior of electronic devices in radiation environments.

3. **System Testing and Verification Methods**: Researchers have developed innovative testing protocols to ensure the reliability and robustness of electronic components in radiation environments. This includes improvements to existing simulation methods and the development of new computational methods to better capture the complex interactions between radiation particles and fundamental materials.

4. **Specific Research Outcomes**: The paper includes 19 high-quality articles covering various aspects from Technology Computer-Aided Design (TCAD) and Geometry And Tracking (GEANT4) to novel numerical computation techniques. It discusses in detail the performance of key components or devices such as sensors, FinFETs, Silicon-On-Insulator (SOI), System-On-Chip (SoC), and carbon nanotubes in radiation environments.

Overall, this paper aims to provide researchers with a comprehensive platform to showcase their latest findings and technological advancements regarding the impact of radiation on advanced electronic devices and circuits. By covering a wide range of topics from fundamental mechanisms to practical applications, the paper promotes collaboration and innovation in the field of radiation effects research, advancing the development of radiation-hardened electronic technology.