Synthesis and Electrical Properties of ZnO Nanowires

Xiaoyan Xing,Kaibo Zheng,Huahua Xu,Fang,Haoting Shen,Jing Zhang,Jian Zhu,Chunnuan Ye,Guanying Cao,Dalin Sun,Guorong Chen
DOI: https://doi.org/10.1016/j.micron.2005.10.010
IF: 2.381
2006-01-01
Micron
Abstract:Vertically aligned ZnO nanowires were synthesized on the p+ silicon chip by modifying the CVD process with a vapor trapping design. Scanning electron microscopy was used to investigate the morphology of as-obtained nanowires. X-ray diffraction showed that the obtained nanowires were ZnO crystalline. The rectifying characteristics of the p–n heterojunction composed of ZnO nanowires and a p+ silicon chip were observed. The positive turn-on voltage was 0.5 V and the reverse saturation current was 0.01 mA. These vertically aligned ZnO nanowires showed a low field emission threshold of 4 V/μm at a current density of 0.1 μA/cm2. The dependence of emission current density on the electric field followed Fowler–Nordheim relationship.
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