Abstract:With the technical breakthroughs of creating oxides by novel thin film deposition techniques with well-defined interfaces, oxides have received increasing attention in the electronic and optoelectronic industry due to their unique com?bination of novel physical properties and the fact that oxides can form “heterostructures” for multiple devices. In order to understand the atomic/electronic structure in oxide interfaces, various characterization techniques have been involved. In the past, the characterization has been limited to broad beam techniques though X?ray absorption spectroscopy ( XAS) , nuclear magnetic resonance ( NMR) to achieve the average physical and chemical information. With techniques such as scanning transmission electron microscopy ( STEM) and electron energy?loss spectroscopy ( EELS) , high?resolution TEM opens the path to the study of chemical composition and bonding information coupled with the atomic level images, and thus provides an ideal tool to investigate individual interface. Interface can?t be physically isolated from the bulk, it is diffi?cult to correctly and effectively extract the weak signal from these interfaces presented in a solid bulk. Such extraction re?mains a very challenging issue even in TEM when thin foils, with thickness less than 100 nm, are used. The visibility of these interfaces can be enhanced by picking up corresponding signals since the elastically scattered electrons contributing to signals from these interfaces are distributed unevenly in space and differently compared to the ones contributed by the bulk. Studying cross?sectional samples provides two?dimensional projected information of the three?dimensional interfacial structures. Accordingly, the atomic structure can be constructed through combining information from different projections. Regarding the fact that EELS signals from the defects and the bulk are distributed similarly in space, a new experimental approach, based on a “thickness” series of EEL spectra containing different bulk contributions, was proposed to effectively extract weak EELS signals from these interfaces. The development of characterization techniques such as TEM has led to improved understanding of oxide interfaces and thus provides great opportunity to create artificial structure for their novel physical properties.

Atomic and Electronic Structures of the Interface and Twin Boundaries in Epitaxial CuO Films on a ZnO Substrate

Interfacial Electronic State Between Hexagonal ZnO and Cubic NiO

Coupling Behaviors of Large Lattice Mismatch Interfaces Between Hexagonal ZnO and Cubic (001)Mgo

Interfaces Between Hexagonal and Cubic Oxides and Their Structure Alternatives

EPITAXIAL GROWTH OF CUPROUS OXIDE ELECTRODEPOSITED ONTO SEMICONDUCTOR AND METAL SUBSTRATES

Short-range Effect at the Semi-Coherent Metal/its Native Oxide Interface

Interfacial electronic states of misfit heterostructure between hexagonal ZnO and cubic NiO

Electronic structure engineering in chemically modified ultrathin ZnO nanofilms via a built-in heterointerface

Structural and electrical properties of (110) ZnO epitaxial thin films on (001) SrTiO3 substrates

Interface structures of inclined ZnO thin film on (011)-MgO substrate with bulk-like optical properties

Heteroepitaxial structure of Zn atoms deposit on graphene, Si (001) and graphene/Si (001) substrates for ZnO nanostructure growth

The Atomic/Electronic Structure of Oxide Interfaces

Interface Design Beyond Epitaxy: Oxide Heterostructures Comprising Symmetry-forbidden Interfaces

Evolution of Wurtzite ZnO Films on Cubic MgO (001) Substrates: a Structural, Optical, and Electronic Investigation of the Misfit Structures.

Interface Design Beyond Epitaxy: Oxide Heterostructures Comprising Symmetry‐forbidden Interfaces

Real-space characterization of tetragonal CuO epitaxial films

Atomic Heterointerfaces in La0.7Sr0.3MnO3/SrIrO3 Superlattices

Structure and Electronic Properties of Interface-Confined Oxide Nanostructures

Growth and Interfacial Interaction of Cu on ZrO2(111) Thin Film

Heteroepitaxial growth and surface electronic structures of ordered zinc oxide films on Mo(110) substrates

Adhesion And Electronic Structures Of Cu/Zn2sno4 Interfaces: A First-Principles Study