A Novel Method for Dielectric Constants Extraction and Material Thickness Derivation

Jingxue Zhang,Zhiping Li,Yao Li,Jungang Miao
DOI: https://doi.org/10.1117/12.2641175
2022-01-01
Abstract:A novel method is proposed in this paper for extracting dielectric constants of non-magnetic materials and deriving material thickness. The extraction process is independent of thickness and does not have ambiguous value. Then the thickness derivation is conveniently based on the calculated dielectric constants. The proposed method is validated by simulation data and achieves reliable dielectric constants and material thickness value. It is verified in the waveguide measurement system and also suitable for coaxial line and free space measurement. This method is appropriate for materials whose properties are unknown or thickness cannot be exactly measured.
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