Abstract:With the development of 5G technology, the accurate measurement of the complex permittivity of a printed circuit board (PCB) in the wide frequency range is crucial for the design of high-frequency circuits. In this paper, a microwave measurement device and method based on the double-sided parallel-strip line (DSPSL) resonator have been developed to measure the complex permittivity of typical PCBs in the vertical direction. The device includes the DSPSL resonator, the DSPSL coupling probe, a pressure monitor, a Farran C4209 vector network analyzer (100 K to 9 GHz), and a FEV-10-PR-0006 frequency multiplier (75–110 GHz). Based on transmission line theory, the physical model of the DSPSL resonator was established, and the relative permittivity and loss angle tangent value of the dielectric substrate were calculated using conformal transformation. To excite the resonator, the DSPSL coupling probe with a good transmission effect was designed, which consists of DSPSL microstrip line (MSL) transition structure and an MSL-WR10 rectangular waveguide converter. To reduce the air gap between the sample and the metal guide band and dielectric support block, and to improve test accuracy, a mechanical pressure device is added to the top of the DSPSL resonator. Based on the DSPSL resonator, we have used the device to test four typical PCBs, namely, polytetrafluoroethylene, Rogers RT/duroid®5880, Rogers RO3006®, and Rogers RO3010®. The results show that the maximum error of the relative permittivity is less than 3.05%, and the maximum error of the loss angle tangent is less than 1.27 × 10−4.

Extracting Extremely Wideband Complex Dielectric Permittivity and Effective Conductivity by Using One Pair of SIW Circular Cavities

High-Order Mode-Matching-Based Single-Cavity Coaxial Transducer for Broadband Measurement of Complex Permittivity

Wideband Circuit Model of Silicon-Based Interconnects Up to 50 GHz

Wideband Description of the Finite-Ground Coplanar Waveguide-Type Structures with Discontinuities

High-Accuracy Complex Permittivity Characterization of Solid Materials Using Parallel Interdigital Capacitor- Based Planar Microwave Sensor

An Enhanced Broadband Continuous Extraction Approach for Complex Propagation Constants of Differential Transmission Lines

A Method to Determine Broadband Complex Permittivity of Thin Film Dielectric Materials up to 60 GHz

Broadband Measurements of the Surface Impedance in Ferromagnetic Wires As a Boundary Condition for Scattering Problems

Extraction of the Complex Permittivity of PCB

High‐precision Dielectric Sensor System Based on Balanced CSRR‐SIW Resonators

Permittivity measurement of high-frequency substrate based on the double-sided parallel-strip line resonator method

A Novel Strategy for Detecting Permittivity and Loss Tangent of Low-Loss Materials Based on Cylindrical Resonant Cavity

Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

Non-contact measurement of complex permittivity based on coupled magnetic and electric resonances

Novel broadband measurement technique on PCB cells for the field- and stress-dependent impedance in ferromagnetic wires

A Systematic Material Characterization Method via Near-Field Scanning Microwave Microscopy

Influence of the PCB Manufacturing Process on the Measurement Error of Planar Relative Permittivity Sensors Up To 100 GHz

An Accurate Retrieval Method for Complex Electrical Parameters of Materials Based on Partially Filled Waveguide

A Dual-Band Resonator Sensor for Low Permittivity Characterization

iQ Cavity for Material Permittivity Characterization

Conductivity Extraction Using a 180 GHz Quasi-Optical Resonator for Conductive Thin Film Deposited on Conductive Substrate