A Novel Low Cost System for Measuring Complex Permittivity of Dielectric Materials

Peng-fei Zhang,Wen-bo Sun,Gang Zhao,Hui Ge,Raj Mittra
2019-01-01
Abstract:A low-cost system for measuring the complex permittivity is presented in this paper. The system is comprised of a coaxial-waveguide transmitter, four segments of empty waveguide (EW) and a shorting terminal. This simple system can determine the permittivity and conductivity of the sample material under test by using a conventional Vector Network Analyzer(VNA). The underlying principle of the measurement technique are presented followed by some simulation and experimental results for a fabricated system, that serve to verify the validity and efficacy of the proposed method.
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