Far-field Characterization of Material Permittivity Based on Nonlinear Inversions

Yingchao Xie,Qingyang Meng,Kuiwen Xu,Lixin Ran,Jun Wang
DOI: https://doi.org/10.1109/COMPEM.2019.8779050
2019-01-01
Abstract:Noncontact measurement of complex permittivity at microwave frequencies is significantly important in various areas of scientific research and engineering applications. In this work, we experimentally investigate a noncontact solution based on nonlinear inversion algorithms which is used in through wall imaging (TWI). Experiments are performed using a setup with the object surrounded by a closed wall. The inversion is based on a twofold subspace-based optimization method, and the results show that the complex permittivity of the object can be successfully retrieved from the measured data. This TWI solution can be modified to achieve a noncontact measurement method.
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