Abstract:In this work, we present a new X-band waveguide (WR90) measurement method that permits the broadband characterization of the complex permittivity for low dielectric loss tangent material specimens with improved accuracy. An electrically long polypropylene specimen that partially fills the cross-section is inserted into the waveguide and the transmitted scattering parameter (S21) is measured. The extraction method relies on computational electromagnetic simulations, coupled with a genetic algorithm, to match the experimental S21 measurement. The sensitivity of the technique to sample length was explored by simulating specimen lengths from 2.54 to 15.24 cm, in 2.54 cm increments. Analysis of our simulated data predicts the technique will have the sensitivity to measure loss tangent values on the order of 10(-3) for materials such as polymers with relatively low real permittivity values. The ability to accurately characterize low-loss dielectric material specimens of polypropylene is demonstrated experimentally. The method was validated by excellent agreement with a free-space focused-beam system measurement of a polypropylene sheet. This technique provides the material measurement community with the ability to accurately extract material properties of low-loss material specimen over the entire X-band range. This technique could easily be extended to other frequency bands.

An Improved NRW Method for Thin Material Characterization Using Dielectric Filled Waveguide and Numerical Compensation

An X-band waveguide measurement technique for the accurate characterization of materials with low dielectric loss permittivity

An Area-Averaged Conformal Technique for the Electromagnetic Simulations of Debye Medium

A Systematic Material Characterization Method via Near-Field Scanning Microwave Microscopy

Attenuation Measurement of the Dielectric Rod Using Parallel Strips with a Resonable Field Environment

A More Accurate Measurement Method of the Dielectric Material Properties With High Tolerance Using an Overmoded Waveguide

Far-field Characterization of Material Permittivity Based on Nonlinear Inversions

An Improved Waveguide Method for Accurate Complex Permittivity Measurement of Medium/High-Loss Material

Challenges of Measuring the Complex Permittivity and Permeability of Thin Materials in Millimeter Wave Regimes (140Ghz–220ghz)

Multiband Permittivity Measurement Using Directional Coupler Based on Groove–Ridge-Gap Waveguide

An Enhanced One-Port Waveguide Method for Sheet Resistance Extraction

Rigorous Multi-modal Analysis of Partially Filled Waveguides for Accurate Permittivity and Permeability Retrievals

Measurement based on twice cavity perturbations for permittivity of dielectric thin films

Novel broadband measurement technique on PCB cells for the field- and stress-dependent impedance in ferromagnetic wires

Noncontact measurement of complex permittivity based on the principle of mid-range wireless power transfer

Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

A CPW Resonator for Complex Dielectric Characterization of Thin Films at W-Band

High-Order Mode-Matching-Based Single-Cavity Coaxial Transducer for Broadband Measurement of Complex Permittivity

An Accurate Retrieval Method for Complex Electrical Parameters of Materials Based on Partially Filled Waveguide

A Method to Determine Broadband Complex Permittivity of Thin Film Dielectric Materials up to 60 GHz

iQ Cavity for Material Permittivity Characterization