Hysteresis analysis of MoS<sub>2</sub> Field Effect Transistors

Alejandro Toral-Lopez,Daniel S. Schneider,Eros Reato,Enrique G. Marin,Francisco Pasadas,Zhenxing Wang,Max C. Lemme,Andres Godoy
DOI: https://doi.org/10.1109/SNW51795.2021.00038
2021-01-01
Abstract:We analyze hysteresis effects in experimental molybdenum disulfide field effect transistors (MoS2-FETs) by numerical simulations. The energy profile, concentration and charge and discharge times of acceptor interface traps are determined from an iterative numerical platform that exploits a measurement methodology based on careful control of timing and bias conditions, which progressively activate the traps.
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