DEGRADATION AND RECOVERY OF POLARIZATION UNDER γ RAYS IN Bi<sub>3.15</sub>Nd<sub>0.85</sub>Ti<sub>3</sub>O<sub>12</sub> FERROELECTRIC CAPACITORS

Tian-zhi Liu,Zhi-gang Zhang,Dan Xie,Yaoqi Dong,Tian-ling Ren,Li-tian Liu,Jun Zhu
DOI: https://doi.org/10.1080/10584580802092472
2008-01-01
Integrated Ferroelectrics
Abstract:ABSTRACT Bi3.15Nd0.85Ti3O12 thin films of mixed orientations were grown on Pt/Ti/SiO2/Si substrates using the sol-gel method. The film annealed at 750°C is composed of grains with sizes of 450 nm. The samples were exposed on different doses of gamma rays. The polarization of the films shows the degradation after irradiation. The remnant polarization decreased from 15 μ C/cm2 to 7.4–9.8 μ C/cm2 at an applied voltage of 8 V. This degradation can be recovered partially to 11 μ C/cm2 by anneal in O2 ambition. The irradiated capacitors did not show any significant fatigue up to 5 × 1010 circles at frequency of 1 MHz. Keywords: ferroelectricBNdTIrradiationFatigue ACKNOWLEDGMENTS The authors are grateful for the financial support from National Natural Science Foundation of China (90407023), and Ying Tong Education Foundation (101063). The authors would like to thank Mr. Wen Xinyi, Mr. Xue Kanhao and Mr. Jia Ze for their help and discussion in this experiment.
What problem does this paper attempt to address?