Properties of Ferroelectric Capacitor YBCO/Pb (Ta0.05Zr0.48Ti0.47) O3/YBCO/Pt/TiO2/SiO2/Si

李启亮,王栩生,殷江,高兴森,刘治国
DOI: https://doi.org/10.3321/j.issn:0469-5097.2001.05.015
2001-01-01
Abstract:Ferroelectric Pb(Ta0.05Zr0.48Ti0.47)O3(PTZT) thin films were deposited on Pt/TiO2/ SiO2/Si (100) substrates using YBa2Cu3O7(YBCO) buffer layer and top electrode. After 1 × 1011 switching cycles at 91 kV/cm applied field, the decays of polarization P* and P^ were only 20% and 6% respectively. No significant degradation of polarization can be found after a waiting time of 1 ×105 second at 145 kV/cm write and read field. Fatigue performance was deteriorated in too high applied field.
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