Static and Dynamic Characteristics of SiC MOSFET under Extremely High Temperature

Xiaohui Lu,Laili Wang,Zaojun Ma,Qingshou Yang
DOI: https://doi.org/10.1109/ecce47101.2021.9595704
2021-01-01
Abstract:SiC power semiconductor is a good solution for the industrial applications at extremely high temperature. However, due to the limitation of the packaging operating temperature, the high-temperature characteristics of SiC devices are still not well understood. And this problem also limits the application of SiC devices at high temperatures. In this paper, a novel method for static and dynamic characteristics tests at high temperature up to $375^{\circ}\mathrm{C}$ is proposed. Based on this method, the static performance of a SiC MOSFET is tested by Agilent B1505A. Then, a double pulse test platform is designed and built. Based on this platform, the switching performance is investigated. And several temperature sensitive electrical parameters are analyzed at high temperature $(25^{\circ}\mathrm{C}-375^{\circ}\mathrm{C})$ for the first time.
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