Tem Study Of Linear And Planar Defects In Icosahedral Al-Li-Cu

Dp Yu,N Baluc,M Kleman
1995-01-01
Abstract:Transmission electron microscopy observations oi as-cast and deformed samples of an Al-Li-Cu icosahedral quasicrystal allowed us to evidence linear and planar defects. Linear defects were found to be isolated dislocations, while planar defects were tentatively identified as pi-type boundaries and low-angle subgrain boundaries. Ail the features of the defects were determined by using a conventional trace analysis technique and by performing extinction Contrast analyses on the basis of extensive dark field tilting experiments and weak beam imaging.
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