Measurement On Three-Dimension Profile Of Mems Device Structures Based On Infrared Light Reflection Interference

Chou Xiujian,Niu Kangkang,Liu Yi,Xue Chenyang,Zhang Wendong
2009-01-01
Abstract:A new method of measuring three-dimension profile of MEMS device structures based on infrared light reflection interference is developed in this paper The measurement system comprised infrared light source, interference microscope, infrared light CCD, ceramic piezo and software of data analyzing. The three-dimension profile of MEMS device structures was obtained by vertical scanning interferometry and consistent with SEM image. Its lateral resolution is 0.18um, vertical resolution is 0.1um. The application of reflection interference technology in three-dimension profile reconstruction was extended from white light to infrared light.
What problem does this paper attempt to address?