The Importance Of The Surface Illumination In Rem

Lm Peng

1990-01-01

Abstract:The illumination of the crystal surface in the transmission electron microscope under reflection geometry is investigated. Distributions of both the incident glancing angle and beam azimuth on the crystal surface have been obtained, and their influence on a REM image is discussed with reference to experimental REM images.

What problem does this paper attempt to address?

Illumination of Crystal-Surfaces in the Electron-Microscope under Rheed and Rem Geometry

LM PENG

DOI: https://doi.org/10.1016/0304-3991(90)90034-j

IF: 2.994

1990-01-01

Ultramicroscopy

Abstract:The illumination of crystal surfaces in the transmission electron microscope under reflection geometry has been investigated. Distributions of both the incident glancing angle and beam azimuth on a perfect crystal surface have been obtained, and their influence on REM imaging of surfaces is discussed with reference to experimental REM images of GaAs and Pt single crystals.
Aberrations in Structured Illumination Microscopy: A Theoretical Analysis

Xin Liu,Shijie Tu,Yan Xu,Hongya Song,Wenjie Liu,Qiulan Liu,Cuifang Kuang,Xu Liu,Xiang Hao

DOI: https://doi.org/10.3389/fphy.2019.00254

IF: 3.718

2020-01-01

Frontiers in Physics

Abstract:In super-resolution optical microscopes, aberrations often compromise the image performances by reducing its resolution and contrast. In previous works, the aberrations in stimulated emission depletion (STED) microscopy and single-molecule localization microscopy (SMLM) have been well-investigated, while the research on the aberrations in structured illumination microscopy (SIM) is not sufficient, the researchers always poured attention into aberrations only in the detection path. In this paper, we investigate the aberrations in SIM in a comprehensive manner, and their causes and effects on both the illumination and the detection paths are discussed. The aberrations in the illumination path may distort illumination patterns, and deteriorate the final images, together with the aberrations in the detection path. In addition, several non-aberration-related factors, especially the misalignment of the incident beams with respect to the objective pupil, can also dramatically influence the performances of SIM. The analysis provides the theoretical basis and for optimizing a SIM system.
Fluorescence emission difference with defocused surface plasmon-coupled emission microscopy.

Baoliang Ge,Liangfu Zhu,Cuifang Kuang,Douguo Zhang,Yue Fang,Ye Ma,Xu Liu

DOI: https://doi.org/10.1364/OE.23.032561

IF: 3.8

2015-01-01

Optics Express

Abstract:A novel fluorescence emission difference method is proposed to improve the lateral resolution of SPCEM without increasing instrument complexity. We discovered the profile of transverse PSF in SPCEM will dramatically change from a hollow spot to a solid spot, when the axial position of sample varies within one wavelength in the vicinity of the focal plane. The subtraction of an image whose PSF is hollow spot and an image with solid PSF will greatly enhance the resolution and contrast of SPCEM images. The mechanism of the distinctive PSF is demonstrated through basic optics theories, and the improvement of lateral resolution is verified by theoretical simulations and experimental results. It is believed that our method will stand out for its pleasant resolution enhancement and its instruments' simplicity to facilitate many biological cellular observations. (C)2015 Optical Society of America
Thermal diffuse scattering and REM image-contrast preservation

L.-M. Peng,J.M. Cowley

DOI: https://doi.org/10.1016/0304-3991(89)90243-X

IF: 2.994

1989-01-01

Ultramicroscopy

Abstract:The diffuse diffraction spots occurring in reflection high energy electron diffraction (RHEED) patterns and not lying on the circle in which the Ewald sphere intercepts a reciprocal plane have been selected for reflection electron microscopy (REM) imaging of Pt(111) surfaces. Application of the boundary conditions for reflection electron diffraction to the inelastic diffusely scattered electrons requires that the thermal diffuse scattering process gives these diffuse diffraction spots in RHEED patterns, and there is no contribution from elastically scattered electrons to the image contrast. Contrast resulting from surface steps has been observed to be well preserved around the near-focus region in the REM images. It has also been observed that the contrast is smeared out rapidly in the off-focus region due to the diffuseness of the thermal diffuse spot used for REM imaging.
Surface Resonance Effects and Beam Convergence in Rem

LM PENG,JM COWLEY

DOI: https://doi.org/10.1016/0304-3991(88)90388-9

IF: 2.994

1988-01-01

Ultramicroscopy

Abstract:Surface resonance effects and beam convergence have a strong influence on the reflection electron microscopy (REM) contrast of surface steps and defects. The effects resulting from the splitting of the reflection peaks, fine structures in the rocking curve around the Bragg angle and the azimuthal dependence of the reflection peak positions are discussed with reference to some experimental images of GaAs and Pt surfaces. Application of the concept of a resonance wave and the dependence of its spatial distribution on the diffraction conditions provides an explanation for the anomalous step contrast observed under the conditions when no strong Bragg reflections exist but the surface resonance effect is present.
Reflection electron imaging of free surfaces and surface/dislocation interactions

L.-M. Peng,J.M. Cowley,Tung Hsu

DOI: https://doi.org/10.1016/0304-3991(89)90239-8

IF: 2.994

1989-01-01

Ultramicroscopy

Abstract:The technique of reflection electron microscopy (REM) has been used to image the free surfaces and the general case of surface/dislocation interaction. The displacement and rotation fields for an arbitrary dislocation meeting a perfect, truncated surface of a semi-infinite elastically isotropic solid at an arbitrary angle have been obtained and used to simulate the REM dislocation images. The results are compared with those for a free surface, taking into account the extra stress relaxation of the surface atoms resulting from the surface/dislocation interaction. The effects of the free surface on the displacement and rotation fields associated with dislocations emerging at the surface are significant; and to match the REM dislocation images with the computed images, the effects of surface/dislocation interaction must be taken into account, in particular, for edge dislocations and dislocations inclined to the surface. Examples are given for dislocations on GaAs(110) and Pt(111) surfaces. By matching the REM images with the computed images the character of some dislocations has been identified.
Spectrum Illumination for 3— Surface Imaging System

XUZhi-hai,FENGHua-jun

2001-01-01

Abstract:A method using spectrum illumination to reconstruct 3-D bject image is a new concept in the field of computer vision.The design of optical illumination system is crucial this method.Several ways to achieve multicolor spectrum illumination are discussed.A prism illumination system is designed by means of aligning symmetrically the prism at the mid-wavelength(nd=1.806 274)of light path and using reflection collimating lens,cylindrical expending lens and two optical shutters.The relations between deviation angles and light wavelengths are given,and some 3-D reconstruction results are presented.
Diffraction contrast in reflection electron microscopy—I. Screw dislocation

L.-M. Peng,J.M. Cowley

DOI: https://doi.org/10.1016/0739-6260(87)90053-0

1987-01-01

Micron and Microscopica Acta

Abstract:The diffraction contrast theory has been used to anslyze the reflection electron microscopy (REM) image features of a normally emerging screw dislocation and the dependence of these features on the incident beam conditions. The reflected beam rocking curve has been assumed to be a Gaussian-like function but with different half-widths on the two sides of a specific Bragg angle. The calculated images show some fine structures around the dislocation core which depend on the incident beam conditions. This dependence suggests a method of measuring the rotation field from surface defects. Experimentally obtained REM images show features which are in good agreement with the diffraction contrst theory.
The image contrast of surface steps in reflection electron microscopy

J.M. Cowley,Lianmao Peng

DOI: https://doi.org/10.1016/S0304-3991(85)80008-5

IF: 2.994

1985-01-01

Ultramicroscopy

Abstract:Steps on the surfaces of crystals, one or more atoms high, show high contrast in reflection electron microscopy (REM) images obtained using diffracted beams produced in grazing incidence in the RHEED mode. An important part of this contrast may be described as phase contrast, produced by the phase difference between waves scattered from the top and bottom of a step. Calculations based on a simple theory for a phase step, taking into account the possibility of large phase changes, deviations of the angle of incidence from the Bragg angle and possible displacements of the objective aperture, show good agreement with the contrast observed for steps on the surfaces of gold and platinum crystals.
Experimental studies of atomic step contrast in reflection electron microscopy (REM)

Tung Hsu,Lian-Mao Peng

DOI: https://doi.org/10.1016/0304-3991(87)90065-9

IF: 2.994

1987-01-01

Ultramicroscopy

Abstract:One-atom-high steps on crystal surfaces have been observed with the Reflection Electron Microscopy (REM) technique. Strong focus-dependent contrast suggests that it is basically phase contrast. In this experimental work we studied the contrast of atomic steps under combined and separated Bragg condition and resonance condition. It is observed that although the resonance condition strongly affects the intensity of the images, the usual phase contrast features are observed only if the Bragg condition is satisfied.
Effects of Surface Stress Relaxation on Reflection Electron Microscopy Images of Normal Emerging Edge Dislocations

L.-M. Peng,J.M. Cowley,Tung Hsu

DOI: https://doi.org/10.1017/s0424820100125221

1987-01-01

Abstract:It has been well established that, due to the termination of the bulk periodic potential at the surface, the forces acting on the surface atoms are no longer symmetrical but the surface atoms are displaced from their ideal lattice positions. Similarly, additional surface relaxation due to the loss of periodicity is expected to occur at the points where some kinds of bulk defects, like dislocations, intersect the surface. There are experimental indications that the rather more pronounced contrast observed in TEM at these intersection points may be contributed to by the additional stress relaxation.The REM technique is sensitive to crystal orientation and provides an ideal method of detecting the surface strain relaxation. The diffraction contrast effects arise from the changes of the angle between the incident beam and the local surface reciprocal lattice resulting from the strain field on the surface.
Artifact-free, Penetration-Adjustable Elliptical-Mirror-based TIRF Microscopy.

Jian Liu,Chenqi Kong,Qiang Li,Weisong Zhao,Mengzhou Li,Shan Gao,Chenguang Liu,Jiubin Tan

DOI: https://doi.org/10.1364/oe.26.026065

IF: 3.8

2018-01-01

Optics Express

Abstract:Evanescent field distribution in the focal region of the elliptical-mirror-based total-internal-reflection fluorescence (e-TIRF) microscopy is analyzed based on vectorial diffraction theory. The simulation demonstrates that the intensity of an evanescent field generated by elliptical mirror decreases exponentially with the penetration depth, and the polarization characteristic of the evanescent wave in various directions is given. We build up an e-TIRF microscope utilizing a focused hollow-cone illumination with all-direction and large range of incidence. The experiment shows the artifact effect can be well suppressed by using the azimuthal-direction illumination method. In addition, the penetration depth of the evanescent field can be controlled by adjusting the sizes of the aperture and obstruction with a large range.
Stray light simulation and control in imaging systems including diffraction elements

Xiaotong Li,Zhaofeng Cen

DOI: https://doi.org/10.1117/12.2312444

2018-01-01

Abstract:Some imaging optical systems include diffraction elements, both the even reflected stray light and multi-order diffraction stray light need to be considered at the image. They are related to the reflectivity and diffraction efficiency of optical surfaces. In this paper the binary tree is employed to describe the multifurcating tree in which each sampling ray's information is kept. According to the multi-order diffraction efficiency, paraxial ray and real sampling rays are traced, and the calculating results are applied to analyze the stray light in optical systems including diffraction components, and then the stray light energy distribution at any space especially at the image can be obtained. A new calculated wavelength is used to replace the designing wavelength for binary optical elements to calculate the reflected diffraction stray light. Based on the principles above, the stray light analysis software is developed. By tracing and analyzing all sampling rays the positions of ghosts are shown, especially at image surface. In this procedure, the first surface of the system serves as the entrance pupil or stop, instead of the entrance pupil in original imaging system, so as to collect all sampling rays from all direction, in or out the field of view, and then all possible ghosts are obtained. According to the simulation, the glare shields or control methods can be designed.
An $\textit{In Situ}$ Light Illumination System for an Aberration-Corrected Environmental Transmission Electron Microscope

Qianlang Liu,Barnaby D. A. Levin,Diane M. Haiber,Joshua L. Vincent,Peter A. Crozier

DOI: https://doi.org/10.48550/arXiv.2104.02006

2021-05-19

Abstract:In this work, an optic fiber based $\textit{in situ}$ illumination system integrated into an aberration-corrected environmental transmission electron microscope (ETEM) is designed, built, characterized and applied. With this illumination system, the dynamic responses of photoactive materials to photons can be directly observed at the atomic level, and other stimuli including heating and various gases can also be applied simultaneously. Either a broadband light source or a high power laser source aiming to expedite photoreactions can be utilized, fitting different application needs. The optic fiber enters the ETEM through the objective aperture port, with a carefully designed curvature and a 30° cut at the tip to orient the emitted light upwards onto the TEM specimen. The intensity distributions striking the sample from the broadband and laser sources are both measured, and due to the non-uniform distributions, an alignment procedure has been developed to align the bright spot with the electron optical axis of the TEM. The imaging and spectroscopy performances of the ETEM are proved to be maintained after incorporating this illumination system. Furthermore, Langmuir evaporation is observed when in situ laser light is applied to GaAs, demonstrating the phenomenon of optical heating on suitable semiconductor materials.

Materials Science
Surface Vs. Bulk Electronic Structure of Silver Determined by Photoemission

N. J. Speer,M. K. Brinkley,Y. Liu,C. M. Wei,T. Miller,T. -C. Chiang

DOI: https://doi.org/10.1209/0295-5075/88/67004

2009-01-01

Europhysics Letters

Abstract:Whether photoemission probes surface or bulk properties has long been a topic of interest and debate. This work employs angle-resolved photoemission to map the electronic structure of Ag films of varying thicknesses prepared on Si(111). As expected, the discrete quantum-well states or subbands observed at small thicknesses merge into a continuum as the film thickness approaches the bulk limit. However, a number of discrete states remain isolated within gaps or pockets in the bulk continuum. While these Ag surface states have been predicted previously by calculations, most are experimentally identified herein only for the first time. Copyright (C) EPLA, 2009
REM Observation of Electron-Beam-induced Reactions on GaAs(110) Surface

Lian‐Mao Peng

DOI: https://doi.org/10.1016/0304-3991(89)90010-7

IF: 2.994

1989-01-01

Ultramicroscopy

Abstract:A reflection electron microscopy (REM) observation has been made of the desorption and migration processes of the As2 molecules and Ga atoms on the GaAs(110) surface, induced by the focused incident fast electron beam. The observations were performed in a conventional TEM instrument. However, by utilising the cold stage, the contaminations can be greatly reduced so that a clean surface could be retained after electron-beam-induced etching of surface carbon contaminants by water vapour. A series of five REM images are presented which show that in some preferential cases even meaningful observations of chemical reactions are possible in spite of the comparatively poor vacuum in the CTEM instrument.
The Surface Step: Its Strain Field and REM Image Contrast Splitting

L.-M. Peng,J.M. Cowley,Tung Hsu

DOI: https://doi.org/10.1017/s042482010012521x

1987-01-01

Abstract:Experimental and theoretical considerations suggest that, due to the loss of two dimensional periodicity of an infinite surface at surface steps, some sort of atomic relaxation will be expected to occur around the step . A proposed surface step model is shown in Fig.l. A surface step (Fig.1c) may be decomposed into a perfect surface step (Fig.1a) and a distortion field around the step (Fig.1b). Since the perfect surface step produces phase contrast but does not produce diffraction contrast or contribute to the step contrast splitting, only the distortion field will be considered.Shown in Fig.2 is the distortion field distribution associated with the surface step and the corresponding variation in its local incident angle. Fig.3 is the reflected intensity rocking curve around a specific Bragg angle. While the reflected beam from the undistorted surface area that is far from the step gives the background reflection intensity, the local variation in the incident angle, along with the dependence of the reflected beam intensities on the incident angle, will produce diffraction contrast in reflection.
Diffraction Contrast in Reflection Electron Microscopy—ii. Surface Steps and Dislocations under the Surface

LM PENG,JM COWLEY,T HSU

DOI: https://doi.org/10.1016/0739-6260(87)90054-2

IF: 1.9522

1987-01-01

Journal of Microscopy

Abstract:The double line contrast of the surface step REM image has been observed and interpreted successfully by using the simple diffraction contrast theory. A surface step model has been proposed. Calculations based on the model suggest that under some optimum conditions the splitting of the in-focus contrast of a surface step can provide a measurement of the strain field associated with the surface step. A similar but much more diffused line contrast has also been observed and can be explained as arising from dislocations lying beneath, but parallel to, the surface.
Geometric Analysis of Surface Resonance Conditions in Reflection High Energy Electron Diffraction

LM PENG,JM COWLEY

DOI: https://doi.org/10.1002/jemt.1060060107

1987-01-01

Journal of Electron Microscopy Technique

Abstract:AbstractA three‐dimensional analysis in reciprocal space is used to analyse reflection high energy electron diffraction (RHEED) patterns. Particular emphasis is placed on investigating the surface resonance phenomenon, the resonance conditions, and the diffraction mechanisms. The surface resonance regions defined by the resonance beam threshold conditions are related to the limits for the specular reflection spot in the diffraction pattern. The introduction of an Ewald sphere of varying radius is shown to be useful in understanding the surface phenomenon. Simulations based on the geometric theory, taking account of the surface refraction effect, describe very well the RHEED pattern geometry from the (111) surface of a platinum single crystal.
A Multislice Approach to the Rheed and Rem Simulation

Lian‐Mao Peng,J COWLEY

DOI: https://doi.org/10.1017/s0424820100143511

1986-01-01

Abstract:The multislice method of calculating dynamical diffraction is based on the physical optics theory of Cowley and Moodie, which has been shown is equivalent to the quantum theory, back scattering being neglected. This method is capable of the calculation of RHEED diffraction amplitudes and the REM image simulation provided that the surface structure and surface potential have been properly modeled. The procedure for RHEED and REM calculations used her,e is basically the same as the conventional multislice calculation. The periodic continuation assumption has been employed to include the desired model surface (Fig. 1). A large dimension normal to the surface must be used so that there is no interference between these extended unit cells. The choice of the specimen thickness depends on the competition between the requirements for short computing time and larger model surface required to simulate the real equilibrium diffraction processes.

The Importance Of The Surface Illumination In Rem

Illumination of Crystal-Surfaces in the Electron-Microscope under Rheed and Rem Geometry

Aberrations in Structured Illumination Microscopy: A Theoretical Analysis

Fluorescence emission difference with defocused surface plasmon-coupled emission microscopy.

Thermal diffuse scattering and REM image-contrast preservation

Surface Resonance Effects and Beam Convergence in Rem

Reflection electron imaging of free surfaces and surface/dislocation interactions

Spectrum Illumination for 3— Surface Imaging System

Diffraction contrast in reflection electron microscopy—I. Screw dislocation

The image contrast of surface steps in reflection electron microscopy

Experimental studies of atomic step contrast in reflection electron microscopy (REM)

Effects of Surface Stress Relaxation on Reflection Electron Microscopy Images of Normal Emerging Edge Dislocations

Artifact-free, Penetration-Adjustable Elliptical-Mirror-based TIRF Microscopy.

Stray light simulation and control in imaging systems including diffraction elements

An $\textit{In Situ}$ Light Illumination System for an Aberration-Corrected Environmental Transmission Electron Microscope

Surface Vs. Bulk Electronic Structure of Silver Determined by Photoemission

REM Observation of Electron-Beam-induced Reactions on GaAs(110) Surface

The Surface Step: Its Strain Field and REM Image Contrast Splitting

Diffraction Contrast in Reflection Electron Microscopy—ii. Surface Steps and Dislocations under the Surface

Geometric Analysis of Surface Resonance Conditions in Reflection High Energy Electron Diffraction

A Multislice Approach to the Rheed and Rem Simulation