Abstract:A high energy electron diffraction experimental has been carried out in which both the reflection high energy electron diffraction pattern (RHEED) and transmission high energy electron diffraction pattern (THEED) are recorded together from the edge of a GaAs bulk crystal specimen. The combined diffraction pattern shows clearly the existence of the surface resonance waves when the surface resonance diffraction conditions are satisfied, and the close correlation between the intensity enhancement and the surface resonance waves. Strong intensity dependence of the specular reflection and surface resonance spot on the positions of the specular reflection spot along the Kikuchi envelopes, and experimental identification of the surface resonace region, demonstrates the relationship of the resonance diffraction processes to the three-dimensional diffraction conditions. However, the fact that the wavefield for the surface-channelled electrons is confined to a few atomic layers on the surface is indicated by the elongatition of the transmitted diffraction spots. Generation of diffusely scattered electrons by the surface-channelled electrons produces diffuse bands in the diffraction pattern, parallel to the surface.

Surface Resonance Effects and Beam Convergence in Rem

Fluorescence emission difference with defocused surface plasmon-coupled emission microscopy.

Resolution-enhanced Surface Plasmon-Coupled Emission Microscopy

Experimental studies of atomic step contrast in reflection electron microscopy (REM)

The image contrast of surface steps in reflection electron microscopy

Diffraction Contrast in Reflection Electron Microscopy—ii. Surface Steps and Dislocations under the Surface

Illumination of Crystal-Surfaces in the Electron-Microscope under Rheed and Rem Geometry

The observation of surface resonance effects in RHEED patterns

Thermal diffuse scattering and REM image-contrast preservation

Improved Sensitivity for Subsurface Imaging by Contact Resonance Atomic Force Microscopy Using Fano Peaks

Diffraction contrast in reflection electron microscopy—I. Screw dislocation

Geometric Analysis of Surface Resonance Conditions in Reflection High Energy Electron Diffraction

The Surface Step: Its Strain Field and REM Image Contrast Splitting

The Importance Of The Surface Illumination In Rem

A Note on the General Bloch Wave Theory and Boundary Problems in RHEED and REM

Experimental Studies of Surface Resonance Scattering Processes in Rheed

Reflection electron imaging of free surfaces and surface/dislocation interactions

REM Observation of Electron-Beam-induced Reactions on GaAs(110) Surface

Surface Structural Sensitivity Of Convergent-Beam Rheed: Si (001)2x1 Models Compared With Dynamical Simulations

Effects of Surface Stress Relaxation on Reflection Electron Microscopy Images of Normal Emerging Edge Dislocations

A Multislice Approach To The Rheed And Rem Calculation