Fabrication on n-Ga<sub>2</sub>O<sub>3</sub>/p-GaN diode by wet-etching lift-off and transfer-print

Yang Liu,Lai Wang,Yuantao Zhang,Xin Dong,Zhibiao Hao,Yi Luo,Changzheng Sun,Yanjun Han,Bing Xiong,Jian Wang,Hongtao Li
DOI: https://doi.org/10.1109/EDTM50988.2021.9420881
2021-01-01
Abstract:In the paper, we transfer-print a 5 x 5mm(2) n-type beta-Ga(2)O3 nanomembrane onto a p-GaN/sapphire substrate to form an n-Ga2O3/p-GaN diode, after repairing the dry-etching damage of p-GaN during the device fabrication. The diode has excellent electrical performance, including high rectification ratio (similar to 3.65 x 10(6) at +/- 5 V) and low dark current density (similar to 2.19x10(-7) Acm(-2) at -5 V). These results indicate that wet-etching lift-off and transfer-print technique can be used to fabricate high quality Ga2O3-based heterojunction bipolar devices.
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