High-quality crystalline NiO/β-Ga2O3 p–n heterojunctions grown by the low-cost and vacuum-free mist-CVD for device applications

Zeyulin Zhang,Qingwen Song,Dinghe Liu,Yiru Yan,Hao Chen,Changgen Mu,Dazheng Chen,Qian Feng,Jincheng Zhang,Yuming Zhang,Yue Hao,Chunfu Zhang
DOI: https://doi.org/10.1007/s40843-023-2801-2
2024-04-28
Science China Materials
Abstract:Gallium oxide (Ga 2 O 3 ) p–n heterojunctions play an important role in addressing the difficulties in Ga 2 O 3 p-type doping. Therefore, an efficient and economical fabrication method needs to be established to create single-crystal Ga 2 O 3 heterojunctions for device applications. In this work, we successfully achieved epitaxial growth of single-crystal nickel oxide (NiO) and β-Ga 2 O 3 heterojunctions based on the low-cost and vacuum-free mist chemical-vapor deposition. The full width at half maximum of the X-ray diffraction rocking curves of NiO (111) and β-Ga 2 O 3 (−201) reached 0.077° and 0.807°, respectively. The energy band between NiO and β-Ga 2 O 3 has a Type II heterojunction. Finally, we prepared a quasi-vertical diode based on the NiO/β-Ga 2 O 3 heterojunction, which exhibits obvious rectification characteristics of the p–n junction and provides a reverse breakdown voltage of 117 V. This work proposes a low-cost fabrication method for β-Ga 2 O 3 p–n heterojunctions.
materials science, multidisciplinary
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