Dieletric Properties Modeling Studies of Silicon Nitride Ceramic in High Temperature

Wenfan ZHONG,Mengqiang WU
DOI: https://doi.org/10.3969/j.issn.1004-2474.2014.05.046
2014-01-01
Abstract:In this paper,the polarization mechanism of the silicon nitride ceramics are studied by using dielectric physics and mathematical methods.The contribution to the dielectric constant of silicon nitride is divided into elec-tronic displacement polarization,ionic polarization and thermal ion polarization,and explain the gap of dielectric con-stant between theα-Si3 N4 andβ-Si3 N4 .Understanding the dielectric loss is produced by relaxation loss and conduc-tivity loss,then analyzing main function they played in different temperature,calculate dielectric constant temperature coefficient.Finally,modeling the influence factors and changes with temperature of the dielectric constant and dielec-tric loss which can fit the experiment data well.
What problem does this paper attempt to address?