Single Crystalline Β-Ga2o3 Homoepitaxial Films Grown by MOCVD

Zeming Li,Teng Jiao,Jiaqi Yu,Daqiang Hu,Yuanjie Lv,Wancheng Li,Xin Dong,Baolin Zhang,Yuantao Zhang,Zhihong Feng,Guoxing Li,Guotong Du
DOI: https://doi.org/10.1016/j.vacuum.2020.109440
IF: 4
2020-01-01
Vacuum
Abstract:beta gallium oxide (beta-Ga2O3) homoepitaxy films were grown on ((2) over bar 01) beta-Ga2O3 substrates by metal organic chemical vapor deposition (MOCVD). The effect of growth temperature on the crystalline quality was measured and systematically analyzed. The results showed the growth temperature played an important role in crystalline quality of beta-Ga2O3. The optimized single crystalline beta-Ga2O3 film was grown at 750 degrees C, and the full width at half maximum (FWHM) of X-ray diffraction (XRD) rocking curve was 21.6 arcsec, smaller than that of the beta-Ga2O3 substrate (26.3 arcsec). The film exhibited a greatly smooth surface and the root-mean-square (RMS) roughness was 0.68 nm. And the arrangement of atoms inside the film was in good accordance with lattice constants of beta-Ga2O3. In addition, the effect of the band structure on the luminescent properties of beta-Ga2O3 was
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