Abstract:New results on the study of radiation effects in solid nitrogen and N$_2$-doped Ne matrix are presented with a focus on the so-called $\gamma$-line origin. The irradiation was carried out in dc regime with an electron beam of subthreshold energy. Relaxation dynamics was monitored by emission spectroscopy - cathodoluminescence (CL) and nonstationary luminescence (NsL), along with current activation spectroscopy. Thermally stimulated luminescence (TSL) and exoelectron emission (TSEE) of pure nitrogen and N$_2$ in the Ne matrix were measured in a correlated manner. Three emission bands were recorded in the NIR CL spectra of solid N$_2$: 794, 802, and 810 nm. The band at 810 nm was detected for the first time. These three bands are characterized by similar behavior and form molecular series with spacing between adjacent vibrational energy levels of the ground state of 125 cm$^{-1}$ and 123 cm$^{-1}$. These data cast doubt on the recently made assumption that the $\gamma$-line is attributed to the emission of the nitrogen anion N$^-$ [19]. The processes of an electron attachment and neutralization of positively charged species are discussed. It has been established that the $\gamma$-line in the TSL spectra of pure nitrogen and N$_2$-doped Ne matrix correlates with TSEE currents and recombination emission of O$^+$, N$_2^+$, and N$_4^+$ ions, which indicates its connection with the neutralization reaction. The measurement of NsL supported this conclusion. A new possible assignment of the $\gamma$-line and its satellites to the emission of tetranitrogen N$_4$ is discussed.

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Anisotropic Spectroscopy of Nitrogen K-edge in Group-Iii Nitrides

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Photoinduced Formation of N2 Molecules in Ammonium Compounds.

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X-ray absorption near edge spectroscopy with a superconducting detector for nitrogen dopants in SiC

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