Applications of X-Ray Absorption Fine Structure in Materials Science
Yu WANG,Jiong LI,Shuo ZHANG,Jingyuan MA,Lihua WANG,Xiangjun WEI,Yuying HUANG,Zheng JIANG
DOI: https://doi.org/10.7502/j.issn.1674-3962.2017.03.05
2017-01-01
Abstract:X-ray absorption fine structure (XAFS) is a very powerful technique to investigate the local electronic and geometrical structure around the photoabsorber,which is developed along with synchrotron radiation.Compared with x-ray diffraction (XRD),XAFS is solely sensitive to the local structure of atoms neighboring the absorbing one,and has been exploited for studying condensed matter,solution,even gas.In this review,the basic principle and several experiment methods of XAFS have been reported.Combined with scientific results of XAFS station (Beamline 14W1),we highlight recent applications of XAFS on catalytic materials,energy materials,nanomaterials,semiconductor materials and other hot fields of materials science research,as well as introduce the important roles XAFS played in materials science research.At last,possible applications of XAFS are discussed according to the developing trend of XAFS method at home.