Analysis of extended X-ray absorption fine structure (EXAFS) data using artificial intelligence techniques
Jeff Terry,Miu Lun Lau,Jiateng Sun,Chang Xu,Bryan Hendricks,Julia Kise,Mrinalini Lnu,Sanchayni Bagade,Shail Shah,Priyanka Makhijani,Adithya Karantha,Travis Boltz,Max Oellien,Matthew Adas,Shlomo Argamon,Min Long,Donna Post Guillen
DOI: https://doi.org/10.1016/j.apsusc.2021.149059
IF: 6.7
2021-05-01
Applied Surface Science
Abstract:We have addressed the issue of improper and unreliable analysis of materials characterization data by developing an artificial intelligence based methodology that can reliably and more efficiently analyze experimental results from extended X-ray absorption fine structure (EXAFS) measurements. Such methods help address growing reproducibility problems that are slowing research progress, discouraging the quest for research excellence, and inhibiting effective technology transfer and manufacturing innovation. We have developed a machine learning system for automated analysis of EXAFS spectroscopy measurements and demonstrated its effectiveness on measurements collected at powerful, third generation synchrotron radiation facilities. Specifically, the system uses a genetic algorithm to efficiently find sets of structural parameters that lead to high quality fits of the experimental spectra. A human analyst suggests a set of chemical compounds potentially present in the sample, used as theoretical standards. The algorithm then searches the large multidimensional space of combinations of these materials to determine the set of structural paths using the theoretical standards that best reproduces the experimental data. The algorithm further calculates a goodness of fit value from the suggested standards that can be used to identify the chemical moieties present in the measured sample.
chemistry, physical,physics, applied, condensed matter,materials science, coatings & films