Fabrication and Characterization of Nano-SiO2 Hollow Spheres/Polyimide Composite Films with Low Dielectric Constant

Hong Zhou,Jiao-Jiao Yu,Ming-Yan Zhang,Yu-Sen Yang,Zhi-Min Dang
DOI: https://doi.org/10.1166/jap.2015.1218
2015-01-01
Journal of Advanced Physics
Abstract:In this paper, silica hollow spheres/polyimide (SHS/PI) composite films with low dielectric constant were prepared. Results by TEM and SEM confirmed 50 similar to 70 nm sized silica hollow spheres (SHS) without deformation were formed and dispersed in the PI films. The dielectric constant of the composite films decreased firstly with the increase of SHS contents and the lowest dielectric constant was 2.09 for a hybrid film incorporating 10 wt% SHS. The tensile properties of the composite films degraded with the increasing SHS contents compared to those of pure PI films while they were still sufficient to apply for their use as dielectric and packing materials.
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