Dielectric Properties of Polyimide/Mesoporous Silica Composite Films

Zhi‐Min Dang
2008-01-01
Abstract:Polyimide/mesoporous silica(PI/MCM-41) composite films were prepared by using in-situ dispersive polymerization.The structure of hexagonal MCM-41 was observed with powder X-ray diffraction(XRD) and transmission electron microscope(TEM).Meanwhile,the dispersion of MCM-41 was observed with scanning electron microscope(SEM).Moreover,the dependence of dielectric properties of the composite films on MCM-41 loading was studied.The results show that the volume resistivity and dielectric strength of the composite films increased simultaneously.The volume resistivity of the composite films with 3.0wt% MCM-41 is 10 times as large as that of pure PI film,and increased from 2.8×1014 Ω·m to 2.1×1015 Ω·m.Meanwhile,the dielectric constant of the composite film decreased from 3.26 to 2.86 and the dielectric loss just deteriorated slightly.
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