Abstract:Indium seals have been used extensively in ultra-high vacuum and cryogenic applications. Typically, these seals use indium alongside or in place of other metal gaskets in stainless-steel vacuum flanges, with some custom applications for flanges sealing directly with glass (optics or tubes). Here, we present the design and performance of three pressed indium seals (99.99% In) between aluminum and 0.5 in. diameter sapphire optics and aluminum and gold coated Kovar semiconductor packages (TO-66 and TO-39). Test fixtures were designed to mimic those of future tunable diode laser spectrometers for Earth, planetary, and manned spaceflight environmental monitoring applications. Successful high-hermeticity seals [<10-10 atm cc/s (He)] were achieved for all seals formed with sufficient pressure applied to allow indium to flow between mating surfaces. The hermeticity of the seals was maintained after temperature cycling (-10 to +80 °C, 20 cycles), with the optical seals surviving extended duration tests (-55 to +85 °C, per MIL-STD-883). Semiconductor packages (TO-39) subjected to these extended tests saw a moderate increase in leak rate [∼5 × 10-9 atm cc/s (He)]; however, further testing showed that either the glass-metal package seals or the indium were affected (the sample size was too small to draw firm conclusions for future applications). Overall, these results suggest long-term survivability of indium seals for Kovar-aluminum and sapphire-aluminum interfaces [>10 years at 10-10 atm cc/s (He)], where the coefficient of thermal expansion differs by approximately four times.

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