Study on Injection Efficiency in InGaN

LAI WANG,JIAXING WANG,HONGTAO LI,GUANGYI XI,YANG JIANG,WEI ZHAO,YANJUN HAN,YI LUO
IF: 2.819
2008-01-01
Applied Physics Express
Abstract:The dependence of the electrical efficiency on the injection current was studied in detail in InGaN/GaN multiple quantum wells (MQWs) blue light emitting diodes. When the IhGaN quantum well thickness increased from 2 to 3.5 nm, or the Al component in p-AIGaN changed from 0.1 to 0.2, it was found that the electrical efficiency decreased dramatically, while a thin Mg-doped GaN layer inserted between p-AIGaN and MQWs with optimized Mg concentration can enhance the electrical efficiency effectively. Analysis shows that the injection efficiency was dramatically affected by the interface states due to the strong stress at the interface between p-AIGaN blocking layer and MQWs active region and the capability of electrons arriving at the interface.
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