A Combined Temperature and Capacitance Sensor Interface

Wei WU,Ning DENG
DOI: https://doi.org/10.13911/j.cnki.1004-3365.2017.06.012
2017-01-01
Abstract:A combined temperature and capacitance sensor interface was designed in the NXP 0.16 μm CMOS process.The temperature-sensing front-end was based on the temperature dependency of bipolar transistors,and it translated the temperature into voltage.The capacitance sensor was based on switched-capacitor circuits,and it translated the capacitance into charge domain.The two sensors shared one 2nd-order A-∑ ADC to reduce the chip area.The measured results showed that the temperature sensor had achieved 0.2 ℃ (3σ) inaccuracy within a temperature range of-55 ℃ to 125 ℃,and the capacitance sensor had achieved 0.76 pJ FOM within an input range of 0 to 3.8 pF.The chip occupied 0.2 mm2 area and drew 4.6 μA current from a 1.8 V voltage supply.
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