A 0.8V Capacitively-Biased BJT-Based Temperature Sensor with an Inaccuracy of ±0.4°C ($\mathbf{3}\mathbf{\sigma}$) from −40°C to 125°C in 22nm CMOS

Zhong Tang,Haining Wang,Xiaopeng Yu,Kofi A. A. Makinwa,Nianxiong Nick Tan
DOI: https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631507
2024-01-01
Abstract:The paper presents a compact sub-1V BJT-based temperature sensor for thermal management applications. Capacitively-biased PNPs driven by a regulated charge-pump generate PTAT and CTAT voltages that are readout by an energy and area efficient inverter-based $\Sigma\Delta$ ADC. Fabricated in 22nm CMOS, the sensor occupies 0.01mm 2 and consumes $2.9\mu \mathrm{W}$ from a 0.8V supply. After a 1-point trim, it achieves an inaccuracy of ± 0.4 °C ( $3\sigma$ ) from −40°C to 125°C, which is the best reported in sub-65nm CMOS, as well as high energy efficiency, resulting in a resolution FoM of 0.41pJ.K 2 .
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