A Dynamic-Biased Resistor-Based CMOS Temperature Sensor with a Duty-Cycle-Modulated Output

Zhong Tang,Yun Fang,Xiao-Peng Yu,Zheng Shi,Ling Lin,Nick Nianxiong Tan
DOI: https://doi.org/10.1109/tcsii.2020.2999272
2020-01-01
IEEE Transactions on Circuits & Systems II Express Briefs
Abstract:This brief presents a resistor-based CMOS temperature sensor with a duty-cycle-modulated output. A dynamic-biased resistive analog front-end (AFE) is proposed to generate voltages with positive and negative temperature dependencies. The voltages are then converted into a digital-friendly duty-cycle-modulated output, which can be proceeded by digital systems directly. Fabricated in a standard 0.13-μm CMOS process, this sensor occupies a silicon area of 0.025 mm 2 and can operate with a supply voltage as low as 0.8 V. It has a measured inaccuracy of ±0.85 °C (3σ) from -40 °C to 85 °C after a two-point calibration. Measured at room temperature, it shows a resolution of 0.226 °C in a 0.25-ms conversion time while dissipating 12.5 μW.
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