An Enhancement-Mode Hydrogen-Terminated Diamond Field-Effect Transistor with Lanthanum Hexaboride Gate Material

Wei Wang,Yanfeng Wang,Minghui Zhang,Ruozheng Wang,Gendiang Chen,Xiaohui Chan,Fang Lin,Feng Wen,Kun Jia,Hong-Xing Wang
DOI: https://doi.org/10.1109/led.2020.2972330
IF: 4.8157
2020-01-01
IEEE Electron Device Letters
Abstract:An enhancement-mode hydrogen-terminated diamond field-effect transistor (FET) is realized by using a low work function gate material, namely, lanthanum hexaboride (LaB6). The reason for the enhancement mode should be that the electrons in the LaB6 layer flow into the two-dimensional hole gas (2DHG) channel and compensate the holes, such that the channel is shut down. The threshold voltages (V-TH) range from -0.29 V to -0.72 V with different gate lengths. The device with 2 mu m gate length shows a -57.9 mA/mm maximum drain current density (I-DSmax) at V-GS = -5 V. The on/off ratio is around 9 orders of magnitude, with a subthreshold swing of 130 mV. Effective mobility (mu(eff)) as high as 195.4 cm(2)/V.s is obtained from the device. This technique reveals undamaged 2DHG characteristics, uncontaminated interface between LaB6 and aluminum gate metal, and a simple fabrication process, which will promote the development of enhancement diamond FETs.
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